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Exploration on Electrical Isolation Between High-Voltage SiC Thyristor and Small-Signal Devices for Smart Power Devices

Authors :
Shiwei Liang
Hangzhi Liu
Hengyu Yu
Bingru Chen
Jun Wang
Gaoqiang Deng
Z. John Shen
Source :
IEEE Transactions on Electron Devices. 69:4757-4760
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Details

ISSN :
15579646 and 00189383
Volume :
69
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........1b56e09cfef90befe53c94b1a40356d6