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Analysis of RF Stress Influence on Large-Signal Performance of 22nm FDSOI CMOS Transistors utilizing Waveform Measurement
- Source :
- 2021 16th European Microwave Integrated Circuits Conference (EuMIC).
- Publication Year :
- 2022
- Publisher :
- IEEE, 2022.
Details
- Database :
- OpenAIRE
- Journal :
- 2021 16th European Microwave Integrated Circuits Conference (EuMIC)
- Accession number :
- edsair.doi...........1a9c9649a08ed51601e42ca70271c4b8
- Full Text :
- https://doi.org/10.23919/eumic50153.2022.9783930