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Providing the Low Temperature of the Heat-Generating Power Devices during the Long- Term Experiment
- Source :
- 2021 IEEE 32nd International Conference on Microelectronics (MIEL).
- Publication Year :
- 2021
- Publisher :
- IEEE, 2021.
-
Abstract
- An advanced thermoelectric system has been developed to set a low temperature to the heat-generating power semiconductor devices. The system provides the setting the temperature down to -60°C in a volume of 80x40x12 mm3 at the heat-release up to 13 W. Accuracy of setting the temperature is in the range of ± 3°C. The design of developed system is adopted for long-term tests, including tests in harsh environment. The cooling chamber in may be placed up to 6 m away from the heat exchanger and control unit. One of the main features of new development is its mobility and easy installation when carrying out various types of tests.
Details
- Database :
- OpenAIRE
- Journal :
- 2021 IEEE 32nd International Conference on Microelectronics (MIEL)
- Accession number :
- edsair.doi...........19e8ed53318824c7c5a767d6051e93e9
- Full Text :
- https://doi.org/10.1109/miel52794.2021.9569044