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Providing the Low Temperature of the Heat-Generating Power Devices during the Long- Term Experiment

Authors :
A. S. Kolosova
Dmitry V. Boychenko
G. G. Davydov
P. S. Gromova
M. V. Muzafarov
Alexander A. Pechenkin
Source :
2021 IEEE 32nd International Conference on Microelectronics (MIEL).
Publication Year :
2021
Publisher :
IEEE, 2021.

Abstract

An advanced thermoelectric system has been developed to set a low temperature to the heat-generating power semiconductor devices. The system provides the setting the temperature down to -60°C in a volume of 80x40x12 mm3 at the heat-release up to 13 W. Accuracy of setting the temperature is in the range of ± 3°C. The design of developed system is adopted for long-term tests, including tests in harsh environment. The cooling chamber in may be placed up to 6 m away from the heat exchanger and control unit. One of the main features of new development is its mobility and easy installation when carrying out various types of tests.

Details

Database :
OpenAIRE
Journal :
2021 IEEE 32nd International Conference on Microelectronics (MIEL)
Accession number :
edsair.doi...........19e8ed53318824c7c5a767d6051e93e9
Full Text :
https://doi.org/10.1109/miel52794.2021.9569044