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Position sensitive detectors made by ion implantation in silicon

Authors :
E. Lægsgaard
F. W. Martin
W.M. Gibson
Source :
Nuclear Instruments and Methods. 60:24-26
Publication Year :
1968
Publisher :
Elsevier BV, 1968.

Abstract

Implanted dopant ions are used to form the resistive layer in position sensitive p-n junction particle detectors. Position resolution of 0.2 mm fwhm and linearity of ±0.3 mm are obtained.

Details

ISSN :
0029554X
Volume :
60
Database :
OpenAIRE
Journal :
Nuclear Instruments and Methods
Accession number :
edsair.doi...........19d36e56d5f13384926b4594b29b7e6e