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DX-behavior of Si in AlN

Authors :
Martin S. Brandt
M. W. Bayerl
Martin Stutzmann
Sebastian T. B. Goennenwein
Roman Dimitrov
Oliver Ambacher
R. Zeisel
Source :
Physical Review B. 61:R16283-R16286
Publication Year :
2000
Publisher :
American Physical Society (APS), 2000.

Abstract

In Si doped AlN, a large persistent photoconductivity is found for temperatures below 60 K after exposure to light with photon energies above 1.5 eV. Simultaneously, a persistent electron spin resonance signal is observed with an isotropic g factor of 1.9885 due to an effective mass donor state, while no spin resonance signal is detectable after cooling the sample in the dark. Both observations show that Si undergoes a $\mathrm{DX}$-like metastability in this material. Based on the experimental findings, a detailed configuration diagram is proposed.

Details

ISSN :
10953795 and 01631829
Volume :
61
Database :
OpenAIRE
Journal :
Physical Review B
Accession number :
edsair.doi...........191c0084cb816e40ab0bae46d684552b