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Reliability challenges in Forksheet Devices: (Invited Paper)

Authors :
E. Bury
M. Vandemaele
J. Franco
A. Chasin
S. Tyaginov
A. Vandooren
R. Ritzenthaler
H. Mertens
J. Diaz Fortuny
N. Horiguchi
D. Linten
B. Kaczer
Source :
2023 IEEE International Reliability Physics Symposium (IRPS).
Publication Year :
2023
Publisher :
IEEE, 2023.

Details

Database :
OpenAIRE
Journal :
2023 IEEE International Reliability Physics Symposium (IRPS)
Accession number :
edsair.doi...........190e0b9c0d444b8fede4084cc9f358e7

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