Surface antiferromagnetic domain structures of NiO (001) studied using UV photoemission electron microscope

Direct observation of the antiferro (AF) magnetic domain structures of a NiO (0 0 1) surface is found to be possible using a spectroscopy photoelectron low-energy electron microscope (SPELEEM) and a commercial UV Hg excitation light source without using any polarizers. The principle is based on the magnetic linear dichroism (MLD) effect, where different domain contrasts are produced according to the relative angle between the antiferromagnetic axis and the linearly polarized light. The observed AF magnetic domain structures are strongly affected by both bulk AF magnetic domain structures and the stresses induced during the sample cleaving process. Moreover, the AF magnetic domain structures are found to be irreversible when the sample is heated to over its Neel temperature and then cooled. The possibility of imaging AF magnetic domain structures without using synchrotron radiation or a polarizer is attractive.