Back to Search Start Over

Growth and polarization features of highly (100) oriented Pb(Zr0.53Ti0.47)O3 films on Si with ultrathin SiO2 buffer layer

Authors :
B. R. Zhao
Bingshe Xu
Zhongxian Zhao
Haibing Peng
H. J. Tao
Haohong Chen
F. Wu
Jingsheng Chen
Yue Lin
Source :
Applied Physics Letters. 73:2781-2783
Publication Year :
1998
Publisher :
AIP Publishing, 1998.

Abstract

Highly (100) oriented Pb(Zr0.53Ti0.47)O3 (PZT) films were prepared on Si substrates with ultrathin SiO2 buffer layer by pulsed laser deposition. Hysteresis measurements show that saturation polarization, remnant polarization and coercive field of the films reach 26 μC/cm2, 10 μC/cm2 and 70 kV/cm, respectively. The thickness of SiO2 buffer layer is found to play a significant role on phase purity and orientation of PZT as well as the prevention of interdiffusion. It is also found that the grain size and the interdiffusion between PZT and Si are the key factors for the ferroelectric properties of the films, which are discussed together with the synthesis condition in detail.

Details

ISSN :
10773118 and 00036951
Volume :
73
Database :
OpenAIRE
Journal :
Applied Physics Letters
Accession number :
edsair.doi...........189ec591b1b658fef76116aabe1c741b
Full Text :
https://doi.org/10.1063/1.122589