Effect of uniaxial strain on characteristic frequency of scaled SiGe HBT with embedded stress raiser

Subjects

Subjects :

Modeling and Simulation
Electrical and Electronic Engineering
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

Details

ISSN :

15728137 and 15698025

Volume :

21

Database :

OpenAIRE

Journal :

Journal of Computational Electronics

Accession number :

edsair.doi...........183bac0d5f23c44c7c747cdca0cc5a88

Full Text :

https://doi.org/10.1007/s10825-022-01914-9