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Image Contrast in High Resolution Aberration Corrected Scanning Transmission Electron Microscopy

Authors :
Y Peng
K. van Benthem
S. J. Pennycook
Mark P. Oxley
Source :
Microscopy and Microanalysis. 13
Publication Year :
2007
Publisher :
Oxford University Press (OUP), 2007.

Subjects

Subjects :
Conventional transmission electron microscope
Materials science
Optics
Electron tomography
business.industry
Scanning transmission electron microscopy
Scanning confocal electron microscopy
Scanning ion-conductance microscopy
Energy filtered transmission electron microscopy
business
Instrumentation
Dark field microscopy
Vibrational analysis with scanning probe microscopy

Details

ISSN :
14358115 and 14319276
Volume :
13
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........182a273be0054e8776a79df6e84a1731
Full Text :
https://doi.org/10.1017/s1431927607076428
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