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Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons
- Source :
- 2023 IEEE International Reliability Physics Symposium (IRPS).
- Publication Year :
- 2023
- Publisher :
- IEEE, 2023.
Details
- Database :
- OpenAIRE
- Journal :
- 2023 IEEE International Reliability Physics Symposium (IRPS)
- Accession number :
- edsair.doi...........17501ac4405bd49a0c8b087ffdba2c80
- Full Text :
- https://doi.org/10.1109/irps48203.2023.10118134