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In and out of incidence plane Mueller matrix scattering ellipsometry of rough mc-Si
- Source :
- Thin Solid Films. 571:399-404
- Publication Year :
- 2014
- Publisher :
- Elsevier BV, 2014.
-
Abstract
- A partial in and out of incidence plane Mueller matrix scattering ellipsometry (MMSE) experiment is presented, where the Stokes vectors of the scattered light are detected in slightly more than a quarter hemisphere. The MMSE system is briefly reviewed. The Mueller scattering matrix obtained in reflection from as-cut rough solar grade mc-Si surfaces is reported. For the as-cut surface with an estimated correlation length of 4 μm and root mean square roughness of 550 nm, using an illumination wavelength of 532 nm, the degree of polarization is observed to be larger than 0.86, even far away from the incidence plane.
- Subjects :
- Materials science
Scattering
Plane (geometry)
business.industry
Metals and Alloys
Physics::Optics
Surfaces and Interfaces
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Root mean square
Matrix (mathematics)
Reflection (mathematics)
Optics
Ellipsometry
Materials Chemistry
Degree of polarization
Mueller calculus
business
Subjects
Details
- ISSN :
- 00406090
- Volume :
- 571
- Database :
- OpenAIRE
- Journal :
- Thin Solid Films
- Accession number :
- edsair.doi...........170b8352795940ea7c796a0bbd49086c
- Full Text :
- https://doi.org/10.1016/j.tsf.2014.04.048