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Cross-talk and RTS Noise Characterization of 1- and 2-tier CMOS SPADs in a 150 nm Process

Authors :
Lodovico Ratti
P. Brogi
G. Collazuol
G.-F. Dalla Betta
P.S. Marrocchesi
J. Minga
F. Morsani
L. Pancheri
G. Torilla
C. Vacchi
Source :
2021 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC).
Publication Year :
2021
Publisher :
IEEE, 2021.

Details

Database :
OpenAIRE
Journal :
2021 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Accession number :
edsair.doi...........163c4d22757da9c3c12651df52ba97e0

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