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A pad ICIM model for EMC immunity simulation
- Source :
- 2012 Asia-Pacific Symposium on Electromagnetic Compatibility.
- Publication Year :
- 2012
- Publisher :
- IEEE, 2012.
-
Abstract
- Accurate prediction of the response of integrated circuit (IC) to electromagnetic interferences (EMI) is increasingly important. In this paper, a precise integrated circuit immunity model (ICIM) of electrostatic discharge (ESD) protection pads is developed and validated. The model consists of a parasitic RC network model and an ESD snapback model. The parameters of the physically-based parasitic RC network model are extracted from specifically designed structures with ESD pads and validated by S-parameter measurement data. The combined model is able to predict the immunity level more precisely and better support the immunity simulation of circuit under direct power injection (DPI) test.
- Subjects :
- Engineering
Electrostatic discharge
business.industry
Electromagnetic compatibility
Electrical engineering
Power injection
Hardware_PERFORMANCEANDRELIABILITY
Integrated circuit
law.invention
Snapback
EMI
law
Hardware_INTEGRATEDCIRCUITS
Electronic engineering
business
RC circuit
Hardware_LOGICDESIGN
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2012 Asia-Pacific Symposium on Electromagnetic Compatibility
- Accession number :
- edsair.doi...........16247c53c155c36bc56fd7bb0edd7df5