Back to Search Start Over

The Basis of AES/XPS/SIMS

Authors :
Kazuhiro Yoshihara
Source :
Journal of Surface Analysis. 25:122-135
Publication Year :
2018
Publisher :
Surface Analysis Society of Japan, 2018.

Subjects

Subjects :
Materials science
X-ray photoelectron spectroscopy
Basis (linear algebra)
Analytical chemistry

Details

ISSN :
13478400 and 13411756
Volume :
25
Database :
OpenAIRE
Journal :
Journal of Surface Analysis
Accession number :
edsair.doi...........15a7612064070b78d5546bb812a90e78
Full Text :
https://doi.org/10.1384/jsa.25.122
Full Text Access
View/download PDF

Tools

Authors Abstract Subjects Details