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Contribution from recoiling atoms in secondary electron emission induced by slow highly charged ions from tungsten surface

Authors :
Yongfeng Li
Jieru Ren
Rui Cheng
Xiaoan Zhang
Yuyu Wang
Guoqing Xiao
Lixia Zeng
Xueliang Liu
Zhongfeng Xu
Jianguo Wang
Xianming Zhou
Yu Lei
Xing Wang
Yongtao Zhao
Fuli Li
Yang Yu
Source :
Laser and Particle Beams. 30:707-711
Publication Year :
2012
Publisher :
Hindawi Limited, 2012.

Abstract

The electron emission yield γ induced by Ne2+ and O2+ impacting on a clean tungsten surface has been measured. The range of projectile energy is from 3 keV/u to 14 keV/u. The total electron yield gradually increases with the projectile velocity. It is found simultaneously that the total electron yield for O2+ is larger than the total electron yield for Ne2+, which is opposite to the results for higher projectile velocity. After considering the contribution from recoiling atoms to the energy distribution and electron emission yield, we find that recoiling atoms are of crucial importance in electron emission in our energy range. Thus, the unexpected results in our experiment can be explained successfully.

Details

ISSN :
1469803X and 02630346
Volume :
30
Database :
OpenAIRE
Journal :
Laser and Particle Beams
Accession number :
edsair.doi...........159f4bd83849bf1e175d988013ea85da