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Sample refinement and manipulation of silicon nanowires
- Source :
- Materials Characterization. 48:177-181
- Publication Year :
- 2002
- Publisher :
- Elsevier BV, 2002.
-
Abstract
- Refined silicon nanowires have been prepared by a mild etching process and suspended into liquid in order to make them manageable for individual characterization. A transmission electron microscopy (TEM) study has revealed that the etching starts selectively at defect sites on the wires. This implies that the refined wires have many fewer defects than those made of raw materials. Efforts have been made to mount single nanowires onto the desired electrodes by electrophoresis. Compared with the commonly used microactuation method in the field, this is a far more realistic practical use of the wires that has an industrial value.
- Subjects :
- Materials science
Mechanical Engineering
Nanowire
Nanotechnology
Condensed Matter Physics
Sample (graphics)
Characterization (materials science)
Electrophoresis
Mechanics of Materials
Transmission electron microscopy
Etching (microfabrication)
Electrode
General Materials Science
Silicon nanowires
Subjects
Details
- ISSN :
- 10445803
- Volume :
- 48
- Database :
- OpenAIRE
- Journal :
- Materials Characterization
- Accession number :
- edsair.doi...........157e83c37751481a0ac6745abc26f499
- Full Text :
- https://doi.org/10.1016/s1044-5803(02)00233-4