New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors

Authors :: Robert Lackner
A. Liebel
Maximilian Schmid
Heike Soltau
Daniel Steigenhöfer
Grigore Moldovan
Adrian Niculae
Source :: Microscopy and Microanalysis. 24:650-651
Publication Year :: 2018
Publisher :: Oxford University Press (OUP), 2018.

Subjects :: Optics
Materials science
law
business.industry
Detector
Electron microscope
Backscattered electron
business
Instrumentation
law.invention

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