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Growth and characterization of the InN film ammonification technique
- Source :
- Physica E: Low-dimensional Systems and Nanostructures. 40:664-667
- Publication Year :
- 2008
- Publisher :
- Elsevier BV, 2008.
-
Abstract
- InN film was synthesized by ammoniating indium film on Si(1 1 1) substrates. The samples were analyzed by X-ray diffraction (XRD), X-ray photo-electron spectroscopy (XPS), atomic force microscopy (AFM) and transmission electron microscopy (TEM). The XRD and TEM show that nanoparticles were hexagonal InN single crystals.
- Subjects :
- Diffraction
Indium nitride
Materials science
business.industry
Analytical chemistry
chemistry.chemical_element
Nanoparticle
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
chemistry.chemical_compound
Optics
X-ray photoelectron spectroscopy
chemistry
Transmission electron microscopy
Spectroscopy
business
Single crystal
Indium
Subjects
Details
- ISSN :
- 13869477
- Volume :
- 40
- Database :
- OpenAIRE
- Journal :
- Physica E: Low-dimensional Systems and Nanostructures
- Accession number :
- edsair.doi...........14d5ee6416be837e99a69554fa24b47f
- Full Text :
- https://doi.org/10.1016/j.physe.2007.08.077