Back to Search
Start Over
HAADF-STEM Investigation of III-V Semiconductors Grown on Nanopatterned Si(001) Substrates
- Source :
- Microscopy and Microanalysis. 24:140-141
- Publication Year :
- 2018
- Publisher :
- Oxford University Press (OUP), 2018.
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 24
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........14994611b219327da28631bc588c8a35
- Full Text :
- https://doi.org/10.1017/s1431927618001198