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HAADF-STEM Investigation of III-V Semiconductors Grown on Nanopatterned Si(001) Substrates

Authors :
Hans von Känel
Yadira Arroyo Rojas Dasilva
Gian-Luca Bona
Roksolana Kozak
Marta D. Rossell
Ivan Prieto
Rolf Erni
Source :
Microscopy and Microanalysis. 24:140-141
Publication Year :
2018
Publisher :
Oxford University Press (OUP), 2018.

Details

ISSN :
14358115 and 14319276
Volume :
24
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........14994611b219327da28631bc588c8a35
Full Text :
https://doi.org/10.1017/s1431927618001198