NExT-OOD: Overcoming Dual Multiple-choice VQA Biases

Authors :: Xi Zhang
Feifei Zhang
Changsheng Xu
Source :: IEEE Transactions on Pattern Analysis and Machine Intelligence. :1-18
Publication Year :: 2023
Publisher :: Institute of Electrical and Electronics Engineers (IEEE), 2023.

Subjects :: Computational Theory and Mathematics
Artificial Intelligence
Applied Mathematics
Computer Vision and Pattern Recognition
Software

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