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NExT-OOD: Overcoming Dual Multiple-choice VQA Biases
- Source :
- IEEE Transactions on Pattern Analysis and Machine Intelligence. :1-18
- Publication Year :
- 2023
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2023.
Details
- ISSN :
- 19393539 and 01628828
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Pattern Analysis and Machine Intelligence
- Accession number :
- edsair.doi...........13ca8224b851c242fb31cb57bfe5e6ea