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Development of highly reliable ferroelectric random access memory and its Internet of Things applications

Authors :
Kenji Nomura
Yukinobu Hikosaka
Ko Nakamura
Yuji Kataoka
Hideshi Yamaguchi
Wensheng Wang
Hitoshi Saito
Manabu Kojima
Satoru Mihara
Takashi Eshita
Source :
Japanese Journal of Applied Physics. 57:11UA01
Publication Year :
2018
Publisher :
IOP Publishing, 2018.

Abstract

Ferroelectric random access memory (FRAM) has been commercialized for about 20 years and its reliability has been well proven all over the world. In the recent Internet of Things (IoT) era, it also plays important roles to particularly in edge computing because of its high writing speed, high rewriting endurance, and low writing energy consumption. We review the history of semiconductor memories using ferroelectrics and overview the progresses of the new ferroelectrics and promising ferroelectric applications in the future.

Details

ISSN :
13474065 and 00214922
Volume :
57
Database :
OpenAIRE
Journal :
Japanese Journal of Applied Physics
Accession number :
edsair.doi...........12f015a6e7bdf250be74f7de908cdc8d
Full Text :
https://doi.org/10.7567/jjap.57.11ua01