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Development of highly reliable ferroelectric random access memory and its Internet of Things applications
- Source :
- Japanese Journal of Applied Physics. 57:11UA01
- Publication Year :
- 2018
- Publisher :
- IOP Publishing, 2018.
-
Abstract
- Ferroelectric random access memory (FRAM) has been commercialized for about 20 years and its reliability has been well proven all over the world. In the recent Internet of Things (IoT) era, it also plays important roles to particularly in edge computing because of its high writing speed, high rewriting endurance, and low writing energy consumption. We review the history of semiconductor memories using ferroelectrics and overview the progresses of the new ferroelectrics and promising ferroelectric applications in the future.
- Subjects :
- 010302 applied physics
Random access memory
Hardware_MEMORYSTRUCTURES
Physics and Astronomy (miscellaneous)
Multimedia
business.industry
Reliability (computer networking)
General Engineering
General Physics and Astronomy
02 engineering and technology
Energy consumption
021001 nanoscience & nanotechnology
computer.software_genre
01 natural sciences
Ferroelectricity
Hardware_GENERAL
0103 physical sciences
0210 nano-technology
Internet of Things
business
computer
Edge computing
Random access
Subjects
Details
- ISSN :
- 13474065 and 00214922
- Volume :
- 57
- Database :
- OpenAIRE
- Journal :
- Japanese Journal of Applied Physics
- Accession number :
- edsair.doi...........12f015a6e7bdf250be74f7de908cdc8d
- Full Text :
- https://doi.org/10.7567/jjap.57.11ua01