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Process-Resilient Low-Jitter All-Digital PLL via Smooth Code-Jumping

Authors :
Shi-Yu Huang
Chao-Wen Tzeng
Pei-Ying Chao
Shan-Chien Fang
Chia-Chieh Weng
Source :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 21:2240-2249
Publication Year :
2013
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2013.

Abstract

For an all-digital phase-locked loop, the frequency range supported is often segmented, and this could cause significant jitter when the operating condition (such as the supply voltage and/or the temperature) changes. To address this issue, we present a scheme, called smooth code-jumping, that can stitch together the segmented frequency profile of a digitally controlled oscillator (DCO) into a continuous range, and thereby reduce the jitter significantly. This scheme incorporates a new mirror-DCO-based calibration scheme to take into account process variations. We validate this scheme by test chips in 0.18-μm CMOS technology. Measurement results show that, when operating at 1 GHz, the rms jitter is 4.3 ps (0.43%UI) and the peak-to-peak jitter is 35.6 ps (3.56%UI), respectively.

Details

ISSN :
15579999 and 10638210
Volume :
21
Database :
OpenAIRE
Journal :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Accession number :
edsair.doi...........12ece8f2a8eb5eaf4f8ecd4283cc6468
Full Text :
https://doi.org/10.1109/tvlsi.2012.2230454