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Growth Studies of Silicon Carbide Crystals
- Source :
- Journal of The Electrochemical Society. 113:801
- Publication Year :
- 1966
- Publisher :
- The Electrochemical Society, 1966.
-
Abstract
- Silicon carbide crystals are commonly grown from the vapor at a temperature of about 2600°C in so called "sublimation" furnaces wherein crystals are grown on the inside walls of a cavity formed within a large porous block of silicon carbide. A model for growth in this system is postulated and growth rate as a function of temperature is calculated. Growth in argon with pulses of nitrogen introduced at regular (7½ min) intervals is shown to produce sharp green lines that define the successive crystal sizes during the entire growth period (~8 hr). Temperature changes are made during growth and the growth rates are measured during successive temperature cycles. Considerable fluctuation in growth rate is revealed by this new measuring procedure. Theory and experiment are in qualitative agreement.
- Subjects :
- Materials science
Renewable Energy, Sustainability and the Environment
Nanocrystalline silicon
Analytical chemistry
Condensed Matter Physics
Micropipe
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Carbide
Monocrystalline silicon
Crystal
chemistry.chemical_compound
chemistry
Materials Chemistry
Electrochemistry
Silicon carbide
Sublimation (phase transition)
Growth rate
Subjects
Details
- ISSN :
- 00134651
- Volume :
- 113
- Database :
- OpenAIRE
- Journal :
- Journal of The Electrochemical Society
- Accession number :
- edsair.doi...........12dae4e7f2e9425a3b96930e352d0b73
- Full Text :
- https://doi.org/10.1149/1.2424123