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Surface X-ray diffraction studies of CaF2(110)/Si(001) interface formation

Authors :
Osami Sakata
J. Harada
A. G. Banshchikov
Yoshikazu Takeda
Takayoshi Shimura
Sergey M. Suturin
N. S. Sokolov
R. N. Kyutt
Masao Tabuchi
Source :
Acta Crystallographica Section A Foundations of Crystallography. 64:C556-C556
Publication Year :
2008
Publisher :
International Union of Crystallography (IUCr), 2008.

Subjects

Subjects :
Surface (mathematics)
Crystallography
Materials science
Structural Biology
Interface (Java)
X-ray crystallography

Details

ISSN :
01087673
Volume :
64
Database :
OpenAIRE
Journal :
Acta Crystallographica Section A Foundations of Crystallography
Accession number :
edsair.doi...........129fdbc622d9a5581b66e33ccc536c23
Full Text :
https://doi.org/10.1107/s0108767308082147
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