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Al0.35Ga0.65N pin diodes exhibiting sub-fA leakage currents
- Source :
- Electronics Letters. 41:820
- Publication Year :
- 2005
- Publisher :
- Institution of Engineering and Technology (IET), 2005.
-
Abstract
- Using conventional photolithography, Al 0.35 Ga 0.65 N pin diodes have been fabricated that exhibit extremely low reverse bias leakage currents. Macroscopic I-V measurements from a statistical population of 64, 120 μm diameter, circular diodes gives a mean leakage current of 0.96 fA with a standard deviation of 0.90 fA at -0.5 V bias.
Details
- ISSN :
- 00135194
- Volume :
- 41
- Database :
- OpenAIRE
- Journal :
- Electronics Letters
- Accession number :
- edsair.doi...........11e556e0082f8bf26586b37f998678d0