Inspection of electronic components using dual X-ray energy

X-ray can be applied to obtain a projection image of an object. It is not easy to obtain an high quality image for the object composed of low and high density materials. For the object with large difference in density, it is possible to realize high contrast image using images of low and high tube voltages and image processing. The plastic and metalic parts of the electronic components can be imaged by the dual energy technique which use low and high tube voltages and by processing pixel-by-pixel using visual C++. The contrast-enhanced image can be used to detect and observe defects within the electronic components.