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Mitigation of Total Dose Performance Degradation in an 8–18 GHz SiGe Reconfigurable Receiver
- Source :
- IEEE Transactions on Nuclear Science. 61:3226-3235
- Publication Year :
- 2014
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2014.
-
Abstract
- An 8-18 GHz receiver implemented in silicon-germanium (SiGe) BiCMOS technology is presented. The receiver is designed to enable built-in test (BIT) and consists of a low noise amplifier (LNA), an image-reject mixer, on-chip, automatic gain control (AGC), ring oscillator (RO) sources (used to provide test signals of a predefined amplitude), and digital-to-analog converters (DACs), used for DC bias control of the blocks. The voltage and current biases of both the LNA and the mixer circuit blocks are used as tuning knobs for radio frequency (RF) performance metrics to mitigate the negative effects of total ionizing dose (TID) radiation damage present in extreme environments such as space. Samples of the receiver die were exposed to 10 keV X-rays at 1, 3, and 6 Mrad( SiO2) doses. The BIT system was able to mitigate for TID damage in most cases, with improvements in the key RF metrics of gain, output third-order intercept point (OIP3), and noise figure (NF). The receiver was fabricated in an 0.18 μm SiGe BiCMOS process technology with a peak fT of 150 GHz and nominally consumes 241-243 mA from a 4 V supply.
- Subjects :
- Nuclear and High Energy Physics
Engineering
business.industry
Electrical engineering
Ring oscillator
Converters
Noise figure
Low-noise amplifier
Nuclear Energy and Engineering
Electronic engineering
Automatic gain control
Radio frequency
Electrical and Electronic Engineering
business
DC bias
Voltage
Subjects
Details
- ISSN :
- 15581578 and 00189499
- Volume :
- 61
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Nuclear Science
- Accession number :
- edsair.doi...........104c061f81e28c067367ef1e79acfdf4