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Shrinkage testimation of the shape parameter of an inverse Gaussian distribution using a (α + β)min test

Authors :
Omkar Rai
B.N. Pandey
Source :
Microelectronics Reliability. 37:825-827
Publication Year :
1997
Publisher :
Elsevier BV, 1997.

Abstract

In this paper, we propose a shrinkage testimator for the shape parameter λ of an Inverse Gaussian distribution when the estimated value of λ is available in such a way that either λ = λ1 or λ = λ2(>;λ1) is expected. The (α + β)min test for testing the hypothesis H0: λ = λ1 against H1: λ = λ2 is derived. The shrinkage factors are chosen to be the function of the (α + β)min test. The shrinkage testimator is found to be more efficient (in the sense of the MSE) than the UMVUE in certain parametric space.

Details

ISSN :
00262714
Volume :
37
Database :
OpenAIRE
Journal :
Microelectronics Reliability
Accession number :
edsair.doi...........100d97338e91109efe07baa9793b0787
Full Text :
https://doi.org/10.1016/s0026-2714(96)00132-1