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Barrier thickness dependence of optical properties in GaAs coupled quantum wires

Authors :
Mutsuo Ogura
Kazuhiro Komori
Hirofumi Matsuhata
Fumio Sasaki
Xue-Lun Wang
Source :
Solid-State Electronics. 42:1211-1216
Publication Year :
1998
Publisher :
Elsevier BV, 1998.

Abstract

Barrier thickness dependences, namely coupling strength dependences, of optical properties in GaAs coupled quantum wires are investigated by the photoluminescence (PL), photoluminescence excitation (PLE) and radiative lifetime measurements. In the photoluminescence characteristics, the coupled states of symmetric and antisymmetric states are clearly observed with large barrier thickness dependence. Also, the temperature dependence of the radiative lifetime shows a barrier thickness dependence which might be due to the difference of the oscillator strength in the coupled quantum wires with different barrier thicknesses.

Details

ISSN :
00381101
Volume :
42
Database :
OpenAIRE
Journal :
Solid-State Electronics
Accession number :
edsair.doi...........0ff9d49037aaecc3323071bf245718eb
Full Text :
https://doi.org/10.1016/s0038-1101(98)00006-9