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Scissionable polymer photoresist for EUV lithography

Authors :
Jingyuan Deng
Sean Bailey
Christopher K. Ober
Source :
Advances in Patterning Materials and Processes XXXIX.
Publication Year :
2022
Publisher :
SPIE, 2022.

Details

Database :
OpenAIRE
Journal :
Advances in Patterning Materials and Processes XXXIX
Accession number :
edsair.doi...........0fc29ef8d1ea03c01e67ceefe8585557