System-Independent Characterization of Materials Using Dual-Energy Computed Tomography

MLA

Kyle Champley, et al. “System-Independent Characterization of Materials Using Dual-Energy Computed Tomography.” IEEE Transactions on Nuclear Science, vol. 63, Feb. 2016, pp. 341–50. EBSCOhost, https://doi.org/10.1109/tns.2016.2514364.

APA

Kyle Champley, Daniel J. Schneberk, Maurice B. Aufderheide, Jeffrey S. Kallman, Stephen G. Azevedo, G. Patrick Roberson, William D. Brown, Isaac M. Seetho, Harry E. Martz, & Jerel A. Smith. (2016). System-Independent Characterization of Materials Using Dual-Energy Computed Tomography. IEEE Transactions on Nuclear Science, 63, 341–350. https://doi.org/10.1109/tns.2016.2514364

Chicago

Kyle Champley, Daniel J. Schneberk, Maurice B. Aufderheide, Jeffrey S. Kallman, Stephen G. Azevedo, G. Patrick Roberson, William D. Brown, Isaac M. Seetho, Harry E. Martz, and Jerel A. Smith. 2016. “System-Independent Characterization of Materials Using Dual-Energy Computed Tomography.” IEEE Transactions on Nuclear Science 63 (February): 341–50. doi:10.1109/tns.2016.2514364.