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Mechanism of Aging in Pd-Ag Thick-Film Resistors
- Source :
- IEEE Transactions on Parts, Hybrids, and Packaging. 9:115-122
- Publication Year :
- 1973
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 1973.
-
Abstract
- Accelerated life tests under elevated temperarure, high humidity, and vacuum have been conducted on Pd-Ag thick-film resistors It is found that the change of resistance under those accelerated life test conditions is mainly caused by oxidation and reduction of the electrically conductive components (Pd and Ag) of Pd-Ag thick-film resistors. Through life tests in vacuum, the effect of adsorption was found to be less important than the structural change inside the resistor.
- Subjects :
- Materials science
business.industry
General Engineering
Electrical engineering
Electrically conductive
Industrial and Manufacturing Engineering
Electronic, Optical and Magnetic Materials
Life testing
law.invention
Adsorption
Structural change
law
Life test
Electrical and Electronic Engineering
Resistor
Composite material
business
High humidity
Subjects
Details
- ISSN :
- 03611000
- Volume :
- 9
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Parts, Hybrids, and Packaging
- Accession number :
- edsair.doi...........0e01503cac92736c2f3364fab3eeaef1