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Scanning Transmission Ion Microscopy and Diffraction Imaging
- Source :
- Microscopy and Microanalysis. 16:604-605
- Publication Year :
- 2010
- Publisher :
- Oxford University Press (OUP), 2010.
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
- Subjects :
- Conventional transmission electron microscope
Scanning probe microscopy
Materials science
business.industry
Microscopy
Scanning confocal electron microscopy
Scanning ion-conductance microscopy
Optoelectronics
Energy filtered transmission electron microscopy
business
Instrumentation
Dark field microscopy
Vibrational analysis with scanning probe microscopy
Subjects
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 16
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........0d934a63a3b3f9854cd236a6e18eeb05
- Full Text :
- https://doi.org/10.1017/s1431927610053791