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A high-efficient fault attack on AES S-box

Authors :
Tian Wang
Dunshan Yu
Kai Liao
Nan Liao
Xiaole Cui
Xiaoxin Cui
Source :
2016 Sixth International Conference on Information Science and Technology (ICIST).
Publication Year :
2016
Publisher :
IEEE, 2016.

Abstract

A high-efficient fault attack on AES S-box is proposed in this paper. Faults are introduced in the encryption process by changing the mapping relationship of S-box. Based on the round in which the faults are introduced, two fault models are presented. Attack results show that the first model only needs 16 faulty ciphertexts to recover the 128-bit secret key. The second fault model is more efficient. In this model, two rounds of attacks are enough to find out the 4-byte round-key based on DFA on the 9th round S-box. For covering all the possible fault situations, influence of multi-byte faults are considered, which effectively improves the attack accuracy and reduces the attack rounds. Compared with previous fault models, our work in this paper shows significant advantage of efficiency.

Details

Database :
OpenAIRE
Journal :
2016 Sixth International Conference on Information Science and Technology (ICIST)
Accession number :
edsair.doi...........0d27454918c6bec6ed95e101aa2c4ee7
Full Text :
https://doi.org/10.1109/icist.2016.7483412