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Use Deep Residual GAN to Inference 3D Space Thin Film Laser Damage

Authors :
Guoliang Yang
Junhong Su
Yuan Li
Source :
2022 IEEE Asia-Pacific Conference on Image Processing, Electronics and Computers (IPEC).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE Asia-Pacific Conference on Image Processing, Electronics and Computers (IPEC)
Accession number :
edsair.doi...........0beedd4997ba0ad5560bdb7a1758e1e9
Full Text :
https://doi.org/10.1109/ipec54454.2022.9777464