Evaluation of transmission line and ring oscillator interconnect model for IC applications

The ability of an item to perform a required function under stated conditions for a specified period of time. The main objective of this work is to analyze and estimate the reliability of a transmission line and thirteen stage ring oscillator as interconnects using GPDK 45 nm CMOS technology. As we know that reliability basically depends on HCI NBTI, PBTI and TDDB. Basically in this paper for the performance analysis we have analyzed the results in terms of transient response, delivered power by every component and noise analysis on different incident of time. In this work the reliability factors are done by comparing power, delay and output voltage after a specific amount of time.