Applications of electron microscopy to the characterization of semiconductor nanowires

MLA

John E. Fischer, et al. “Applications of Electron Microscopy to the Characterization of Semiconductor Nanowires.” Applied Physics A, vol. 85, Sept. 2006, pp. 227–31. EBSCOhost, https://doi.org/10.1007/s00339-006-3705-y.

APA

John E. Fischer, Douglas Tham, Chang-Yong Nam, Jinyong Kim, & Kumhyo Byon. (2006). Applications of electron microscopy to the characterization of semiconductor nanowires. Applied Physics A, 85, 227–231. https://doi.org/10.1007/s00339-006-3705-y

Chicago

John E. Fischer, Douglas Tham, Chang-Yong Nam, Jinyong Kim, and Kumhyo Byon. 2006. “Applications of Electron Microscopy to the Characterization of Semiconductor Nanowires.” Applied Physics A 85 (September): 227–31. doi:10.1007/s00339-006-3705-y.