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Deep Adaptive LiDAR: End-to-end Optimization of Sampling and Depth Completion at Low Sampling Rates

Authors :
Alexander W. Bergman
David B. Lindell
Gordon Wetzstein
Source :
ICCP
Publication Year :
2020
Publisher :
IEEE, 2020.

Abstract

Current LiDAR systems are limited in their ability to capture dense 3D point clouds. To overcome this challenge, deep learning-based depth completion algorithms have been developed to inpaint missing depth guided by an RGB image. However, these methods fail for low sampling rates. Here, we propose an adaptive sampling scheme for LiDAR systems that demonstrates state-of-the-art performance for depth completion at low sampling rates. Our system is fully differentiable, allowing the sparse depth sampling and the depth inpainting components to be trained end-to-end with an upstream task.

Details

Database :
OpenAIRE
Journal :
2020 IEEE International Conference on Computational Photography (ICCP)
Accession number :
edsair.doi...........0a94af1e4c289f923ce42050a9ddcb3f
Full Text :
https://doi.org/10.1109/iccp48838.2020.9105252