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Extremely Low Magnification EBSD with an FE-SEM

Authors :
K Ogura
M. Shibata
Charlie Nielsen
Natasha Erdman
K. Kawauchi
Y Yamamoto
Source :
Microscopy and Microanalysis. 16:54-55
Publication Year :
2010
Publisher :
Oxford University Press (OUP), 2010.

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Subjects

Subjects :
Materials science
Metallurgy
Magnification
Instrumentation
Electron backscatter diffraction

Details

ISSN :
14358115 and 14319276
Volume :
16
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........0a5a50b131bc9b2ffce900bf9dea8005
Full Text :
https://doi.org/10.1017/s1431927610056321
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