Back to Search Start Over

DEFECT-RELATED ISSUES IN HIGH-K DIELECTRICS

Authors :
Stephen J. Pennycook
Leonidas Tsetseris
J. D. Joannopoulos
Matthew H Evans
X.-G. Zhang
Sergey N. Rashkeev
Daniel M. Fleetwood
Zhong-Yi Lu
X.J. Zhou
K. van Benthem
Evgeni Gusev
Sokrates T. Pantelides
R. D. Schrimpf
Source :
Defects in High-k Gate Dielectric Stacks ISBN: 1402043651
Publication Year :
2006
Publisher :
Kluwer Academic Publishers, 2006.

Details

ISBN :
978-1-4020-4365-9
1-4020-4365-1
ISBNs :
9781402043659 and 1402043651
Database :
OpenAIRE
Journal :
Defects in High-k Gate Dielectric Stacks ISBN: 1402043651
Accession number :
edsair.doi...........0a50b76b8e2573045576bde40ddbaed2
Full Text :
https://doi.org/10.1007/1-4020-4367-8_15