Meta-Learned and TCAD-Assisted Sampling in Semiconductor Laser Annealing

MLA

Tejender Singh Rawat, et al. “Meta-Learned and TCAD-Assisted Sampling in Semiconductor Laser Annealing.” ACS Omega, vol. 8, Dec. 2022, pp. 737–46. EBSCOhost, https://doi.org/10.1021/acsomega.2c06000.

APA

Tejender Singh Rawat, Chung Yuan Chang, Yen-Wei Feng, ShihWei Chen, Chang-Hong Shen, Jia-Min Shieh, & Albert Shihchun Lin. (2022). Meta-Learned and TCAD-Assisted Sampling in Semiconductor Laser Annealing. ACS Omega, 8, 737–746. https://doi.org/10.1021/acsomega.2c06000

Chicago

Tejender Singh Rawat, Chung Yuan Chang, Yen-Wei Feng, ShihWei Chen, Chang-Hong Shen, Jia-Min Shieh, and Albert Shihchun Lin. 2022. “Meta-Learned and TCAD-Assisted Sampling in Semiconductor Laser Annealing.” ACS Omega 8 (December): 737–46. doi:10.1021/acsomega.2c06000.