Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression

Authors :: Yasuaki Ishikawa
Juan Paolo Bermundo
Mami N. Fujii
Mutsunori Uenuma
Yukiharu Uraoka
Source :: Japanese Journal of Applied Physics. 58:090502
Publication Year :: 2019
Publisher :: IOP Publishing, 2019.

Subjects :: Materials science
Physics and Astronomy (miscellaneous)
business.industry
General Engineering
General Physics and Astronomy
Degradation phenomenon
Metal
Reliability (semiconductor)
Oxide semiconductor
Thin-film transistor
visual_art
visual_art.visual_art_medium
Optoelectronics
business

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