Experimental evidence of harmful exciton dissociation at MoO3/CuPc interface in OPV

MLA

Haomiao Yu, et al. “Experimental Evidence of Harmful Exciton Dissociation at MoO3/CuPc Interface in OPV.” Journal of Applied Physics, vol. 120, Oct. 2016, p. 145501. EBSCOhost, https://doi.org/10.1063/1.4964748.

APA

Haomiao Yu, A. R. Yu, JiHao Zhang, Y. J. Tang, Ruichen Yi, Xiaoyuan Hou, R. C. Shi, & Jiajun Qin. (2016). Experimental evidence of harmful exciton dissociation at MoO3/CuPc interface in OPV. Journal of Applied Physics, 120, 145501. https://doi.org/10.1063/1.4964748

Chicago

Haomiao Yu, A. R. Yu, JiHao Zhang, Y. J. Tang, Ruichen Yi, Xiaoyuan Hou, R. C. Shi, and Jiajun Qin. 2016. “Experimental Evidence of Harmful Exciton Dissociation at MoO3/CuPc Interface in OPV.” Journal of Applied Physics 120 (October): 145501. doi:10.1063/1.4964748.