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Systematic Reliability Evaluation of FPGA Implemented CNN Accelerators

Authors :
Zhen Gao
Shihui Gao
Yi Yao
Qiang Liu
Shulin Zeng
Guangjun Ge
Yu Wang
Anees Ullah
Pedro Reviriego
Source :
IEEE Transactions on Device and Materials Reliability. 23:116-126
Publication Year :
2023
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2023.

Subjects

Subjects :
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Electronic, Optical and Magnetic Materials

Details

ISSN :
15582574 and 15304388
Volume :
23
Database :
OpenAIRE
Journal :
IEEE Transactions on Device and Materials Reliability
Accession number :
edsair.doi...........08d0ddc0872544f9ea81f6d40410eb26
Full Text :
https://doi.org/10.1109/tdmr.2023.3235767
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