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Evaluation of environmental noise susceptibility of RF circuits using direct power injection
- Source :
- 2009 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT).
- Publication Year :
- 2009
- Publisher :
- IEEE, 2009.
-
Abstract
- Susceptibility of radio frequency (RF) circuits against environmental noises was evaluated by way of direct power injection. Measurements performed on a 90-nm 2.45 GHz CMOS RF driver amplifier show that the injection of RF power into on-die p+ guard bands creates tones at the primary and up-converted frequencies. Simulation achieves the error of less than 2dB against the measured susceptibility of −40dB, with the models of passive impedance networks covering probing tips, die pads, metal wirings, as well as a silicon substrate.
Details
- Database :
- OpenAIRE
- Journal :
- 2009 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)
- Accession number :
- edsair.doi...........08441003c853b354a56e099a47073072