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Reliability of optoelectronics components: towards new qualification practices
- Source :
- Microelectronics Reliability. 43:1767-1769
- Publication Year :
- 2003
- Publisher :
- Elsevier BV, 2003.
- Subjects :
- Engineering
business.industry
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Condensed Matter Physics
business
Atomic and Molecular Physics, and Optics
Reliability (statistics)
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Reliability engineering
Subjects
Details
- ISSN :
- 00262714
- Volume :
- 43
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability
- Accession number :
- edsair.doi...........083fdfeaefd142baedf0aefe38b8f5d4
- Full Text :
- https://doi.org/10.1016/s0026-2714(03)00297-x