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Reliability of optoelectronics components: towards new qualification practices

Authors :
D. Laffitte
Jean-Luc Goudard
J. Périnet
X. Boddaert
Source :
Microelectronics Reliability. 43:1767-1769
Publication Year :
2003
Publisher :
Elsevier BV, 2003.

Details

ISSN :
00262714
Volume :
43
Database :
OpenAIRE
Journal :
Microelectronics Reliability
Accession number :
edsair.doi...........083fdfeaefd142baedf0aefe38b8f5d4
Full Text :
https://doi.org/10.1016/s0026-2714(03)00297-x