Cite
Characterisation of High-k Containing Nanolayers by Reference-Free X-Ray Fluorescence Analysis with Synchrotron Radiation
MLA
Jakob Van den Berg, et al. “Characterisation of High-k Containing Nanolayers by Reference-Free X-Ray Fluorescence Analysis with Synchrotron Radiation.” ECS Transactions, vol. 25, Sept. 2009, pp. 293–300. EBSCOhost, https://doi.org/10.1149/1.3204419.
APA
Jakob Van den Berg, Stefan De Gendt, M. A. Reading, Michael Kolbe, Thierry Conard, Burkhard Beckhoff, & Michael Krumrey. (2009). Characterisation of High-k Containing Nanolayers by Reference-Free X-Ray Fluorescence Analysis with Synchrotron Radiation. ECS Transactions, 25, 293–300. https://doi.org/10.1149/1.3204419
Chicago
Jakob Van den Berg, Stefan De Gendt, M. A. Reading, Michael Kolbe, Thierry Conard, Burkhard Beckhoff, and Michael Krumrey. 2009. “Characterisation of High-k Containing Nanolayers by Reference-Free X-Ray Fluorescence Analysis with Synchrotron Radiation.” ECS Transactions 25 (September): 293–300. doi:10.1149/1.3204419.