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Large area deposition of Al2O3 thin films with molecular beams in high vacuum

Authors :
X. Multone
Patrik Hoffmann
C.N. Borca
Source :
Thin Solid Films. 515:7542-7545
Publication Year :
2007
Publisher :
Elsevier BV, 2007.

Abstract

Novel approaches to achieve uniform deposition, in particular for dielectric oxides, are highly desirable in the fields of electronics and optics. We succeeded to deposit thin films of alumina (Al2O3) with high uniformity on 150 mm diameter Si wafers. We use thermal decomposition in oxygen atmosphere of Aluminum isopropoxide, under molecular flow regime, in a High Vacuum Chemical Vapor Deposition (HV–CVD) reactor. © 2006 Elsevier B.V. All rights reserved.

Details

ISSN :
00406090
Volume :
515
Database :
OpenAIRE
Journal :
Thin Solid Films
Accession number :
edsair.doi...........07e8905e92dbe9895add01344f2d44d4
Full Text :
https://doi.org/10.1016/j.tsf.2006.11.163