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Cryogenic Characterization and Analysis of Nanoscale SOI FETs Using a Virtual Source Model
- Source :
- IEEE Transactions on Electron Devices. 69:1306-1312
- Publication Year :
- 2022
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2022.
- Subjects :
- Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Subjects
Details
- ISSN :
- 15579646 and 00189383
- Volume :
- 69
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Electron Devices
- Accession number :
- edsair.doi...........07796db565295956919eddd3422d5f64
- Full Text :
- https://doi.org/10.1109/ted.2022.3142650